검색어 : 통합검색[620.3]
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241
- Discussion of “Collapse of Plate Girders under Edge Loading”
- Hussein, Raafat; Consulting Engr., Shawinigan Consultants Inc., 620 Dorchester Blvd. West, Montreal, Quebec, Canada H3B 1N8; (Proceedings of the American Society of Civil Engineers. Journal of the Structural Division, v.108, 1982, pp.1449-1450)
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242
- On the Thermal Unfolding Character of Globular Proteins
- Muthusamy, R.; Gromiha, M. Michael; Ponnuswamy, P. K.; Department of Physics, Bharathidasan University, Tiruchirapalli 620 024, Tamil Nadu, India; RIKEN Life Science Center, 3-1-1 Koyadai, Tsukuba, Ibaraki 305-0074, Japan. gromiha@rtc.riken.go.jp; Department of Physics, Bharathidasan University, Tiruchirapalli 620 024, Tamil Nadu, India; (Journal of protein chemistry, v.19, 2000, pp.1-8)
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243
- Particle reduction in high temperature sulfuric acid using PTFE membrane filter and low pulsation bellows pump
- Takakura, Tomoyuki; Tokuno, Katsuhiko; Tsuzuki, Shuichi; Yamazaki, Kenji; Tomotoshi, Ai; Teshima, Kazukiyo; ; (SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2018 29th Annual, v.2018, 2018, pp.117-120)
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244.
- 한국과 중국의 가면극 비교연구 : 한국 <송파산대놀이>와 중국 <더장나당희(德江儺堂戲)>를 중심으로
- 왕을청
- 성균관대학교, 국내석사, vii, 79 p., 2018
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245
- Numerical Investigation on the Performance of a 4-Stroke Engine with Different Passive Pre-Chamber Geometries Using a Detailed Chemistry Solver
- Bigalli, Simone; Catalani, Iacopo; Balduzzi, Francesco; Matteazzi, Nicola; Agostinelli, Lorenzo; De Luca, Michele; Ferrara, Giovanni; Department of Industrial Engineering (DIEF), Università degli Studi di Firenze, Via di Santa Marta 3, 50139 Firenze, Italy; Department of Industrial Engineering (DIEF), Università degli Studi di Firenze, Via di Santa Marta 3, 50139 Firenze, Italy; Department of Industrial Engineering (DIEF), Università degli Studi di Firenze, Via di Santa Marta 3, 50139 Firenze, Italy; HPE-COXA, Via R. Dalla Costa 620, 41122 Modena, Italy; HPE-COXA, Via R. Dalla Costa 620, 41122 Modena, Italy; HPE-COXA, Via R. Dalla Costa 620, 41122 Modena, Italy; Department of Industrial Engineering (DIEF), Università degli Studi di Firenze, Via di Santa Marta 3, 50139 Firenze, Italy; (Energies, v.15, 2022, pp.4968)
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246
- Half rotations leading to retention of stereochemistry in epoxide ring opening by selenocyanate ion: Insights from DFT modeling
- Kalaiselvan, Anbarasan; Muthukumar, Kaliappan; Senthilnathan, Dhurairajan; Maldivi, Pascale; Venuvanalingam, Ponnambalam; ; (International journal of quantum chemistry, v.111, 2011, pp.2317-2323)
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247
- M. M. Kipnis. Ob odnom svojstvé propozicionaľnyh formul. Doklady Akadémii Nauk SSSR, vol. 174 (1967), pp. 277-278. - M. M. Kipnis. A property of prepositional formulas. English translation of the preceding by S. Walker. Soviet mathematics, vol. 8 no. 3 (1967), pp. 620-622.
- Rose, Gene F.; ; (The Journal of symbolic logic, v.33, 1968, pp.606-606)
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248
- Susan Frykberg: Astonishing Sense of being taken over by something far greater than me Compact disc, 1998, es 98003; available from earsay productions, Suite 308, 620 Sixth St., New Westminster, British Columbia V3L 3C5, Canada; telephone (604) 527-2358; fax (604) 524-9456; World Wide Web http://www.earsay.com
- Rubin, Anna; Oberlin, Ohio, USA; (Computer music journal, v.23, 1999, pp.108-110)
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249
- A High IIP<SUB>3</SUB> Low Noise Amplifier for 1900 MHz Applications Using the SiGe BFP620 Transistor This extensive application note details the circuit design methods and performance obtained from a low noise amplifier (LNA) for the PCS band that uses a discrete SiGe device
- Wevers, G.; ; (Applied microwave & wireless, v.12, 2000, pp.64-95)
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250
- Stable-wavelength operation of europium-doped GaN nanocolumn light-emitting diodes grown by rf-plasma-assisted molecular beam epitaxy
- Sekiguchi, H.; Imanishi, T.; Matsuzaki, R.; Ozaki, K.; Yamane, K.; Okada, H.; Kishino, K.; Wakahara, A.; Toyohashi University of Technology, Japan; Toyohashi University of Technology, Japan; Toyohashi University of Technology, Japan; Toyohashi University of Technology, Japan; Toyohashi University of Technology, Japan; Sophia University, Japan; Toyohashi University of Technology, Japan; (Electronics letters, v.53, 2017, pp.666-668)
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